Measurement Error in Longitudinal Data

ISBN : 9780198859987

Alexandru Cernat; Joseph W. Sakshaug
464 Pages
164 x 241 mm
Pub date
Mar 2021
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Longitudinal data is essential for understanding how the world around us changes. Most theories in the social sciences and elsewhere have a focus on change, be it of individuals, of countries, of organizations, or of systems, and this is reflected in the myriad of longitudinal data that are being collected using large panel surveys. This type of data collection has been made easier in the age of Big Data and with the rise of social media. Yet our measurements of the world are often imperfect, and longitudinal data is vulnerable to measurement errors which can lead to flawed and misleading conclusions. Measurement Error in Longitudinal Data tackles the important issue of how to investigate change in the context of imperfect data. It compiles the latest advances in estimating change in the presence of measurement error from several fields and covers the entire process, from the best ways of collecting longitudinal data, to statistical models to estimate change under uncertainty, to examples of researchers applying these methods in the real world. This book introduces the essential issues of longitudinal data collection, such as memory effects, panel conditioning (or mere measurement effects), the use of administrative data, and the collection of multi-mode longitudinal data. It also presents some of the most important models used in this area, including quasi-simplex models, latent growth models, latent Markov chains, and equivalence/DIF testing. Finally, the use of vignettes in the context of longitudinal data and estimation methods for multilevel models of change in the presence of measurement error are also discussed.


1 Memory Effects as a Source of Bias in Repeated Survey Measurement
2 A Methodological Framework for the Analysis of Panel Conditioning Effects
3 A longitudinal error framework to support the design and use of integrated datasets
4 Modeling Mode Effects for a Panel Survey in Transition
5 Estimating Mode Effects in Panel Surveys: A Multitrait Multimethod Approach
6 Developing Reliable Measures: An Approach to Evaluating the Quality of Survey Measurement Using Longitudinal Designs
7 Assessing and relaxing assumptions in quasi-simplex models
8 Modelling error dependence in categorical longitudinal data
9 Reliability in Latent Growth Curve Models
10 Longitudinal Measurement (Non)Invariance in Latent Constructs: Conceptual Insights, Model Specifications and Testing Strategies
11 Measurement invariance with ordered categorical variables: applications in longitudinal survey research
12 Self-evaluation, Differential Item Functioning and Longitudinal Anchoring Vignettes
13 The Implications of Functional Form Choice on Model Misspecification in Longitudinal Survey Mode Adjustments
14 Disappearing errors in a conversion model
15 On Total Least Squares Estimation for Longitudinal Errors-in-Variables Models
16 Comparison of Reliability in Seventeen European Countries Using the Quasi-Simplex Model
17 Establishing measurement invariance across time within an accelerated longitudinal design

About the author: 

Alexandru Cernat is a senior lecturer in the Social Statistics Department at the University of Manchester. He has a PhD in survey methodology from the University of Essex and was a post-doc at the National Centre for Research Methods and the Cathie Marsh Institute. His research and teaching focus on: survey methodology, longitudinal data, measurement error, latent variable modelling, new forms of data and missing data.; Joseph W. Sakshaug is Deputy Head of Research and Head of the Data Collection and Data Integration Unit in the Statistical Methods Research Department at the Institute for Employment Research (IAB) in Nuremberg. He is also University Professor of Statistics in the Department of Statistics at the Ludwig Maximilian University of Munich, and Honorary Professor in the School of Social Sciences at the University of Mannheim. His research and teaching focuses on survey design and estimation, nonresponse and measurement error, and data integration.

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